Metallurgy - Materials Characterization (English)

   Friday, May 16, 2025   

Starting a new Lecture Notes Series on Metallurgy - Materials Characterization

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Lecture 1: Properties of light, Image formation

Lecture 2: Magnification and resolution

Lecture 3: Depth of field,focus and field of view

Lecture 4: Lens defects,filters and light microscopy introduction

Lecture 5: Optical microscope demo., Bright field imaging, opaque specimen illumination

Lecture 6: Opaque stop microscopy, Phase contrast microscopy

Lecture 7: Dark field microscopy, Polarization microscopy

Lecture 8: Differential interference contrast and fluorescence microscopy

Lecture 9: Sample preparation techniques for optical microscopy

Lecture 10: Tutorial problems

Lecture 11: continuation-Tutorial problems

Lecture 12: Introduction to scanning electron Microscopy

Lecture 13: Lens aberrations, Object resolution, Image quality

Lecture 14: Interaction between electrons and sample, Imaging capabilities

Lecture 15: SEM and its mode of operation, Effect of aperture size,Working distance,condenser lens strength

Lecture 16: SEM and its mode of operation- continuation

Lecture 17: Factors affecting Interaction volume, Demonstration of SEM

Lecture 18: Image formation and interpretation

Lecture 19: Image formation and interpretation continued, EDS, WDS

Lecture 20: Special contrast mechanisms, Monte Carlo simulations of Interaction volume

Lecture 21: Electron channeling contrast imaging (ECCI), (EBSD)-Theory & instrument demonstration

Lecture 22: Tutorial Problems on SEM

Lecture 23: Basics of X-ray emission from source, electron excitation and X-ray interaction

Lecture 24: Properties of X-rays

Lecture 25: Bragg's Law Derivation

Lecture 26: Diffraction relationship with reciprocal space

Lecture 27: X-ray scattering

Lecture 28: Factors affecting intensities of X-ray peaks

Lecture 29: Factors affecting intensities of X-ray peaks- continuation

Lecture 30: Effect of crystallite size and strain on intensity of X-rays

Lecture 31: Profile fit, Factors affecting peak brodening

Lecture 32: Indexing of diffraction pattern, Quantitative analysis

Lecture 33: Indexing, Quantitative analysis-continuation, Residual stress measurements

Lecture 34: XRD and Residual stress measurement- lab demonstration

Lecture 35: Introduction to Transmission Electron Microscopy (TEM)

Lecture 36: Fundementals of Transmission Electron Microscopy (TEM)

Lecture 37: Basics of Diffraction-1

Lecture 38: Basics of Diffraction-2

Lecture 39: TEM imaging-1

Lecture 40: TEM imaging-2

Lecture 41: TEM instrument demonstration

Lecture 42: TEM sample preparation-1-

Lecture 43: TEM sample preparation-2